Scanning Electron Microscope

2 cases · 4 images

Crevice Corrosion in a Subsea System — Aspect Before Analysis

Application: Structure Standard: UNS Detail focus: Microstructure clear all

Scanning Electron Microscope — sub-branches

Micrography by SEM 4

Results

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Micrography, by scanning electron microscopy. The alloy is a precipitation hardened material, and the stains at the surface are associated to differential etching in second phases and inclusions.
35
VIEW
ML00145 / Sep.2018
Impact of a .380 Winchester on 6061 T6 Plate
M - Aluminum Magnesium SiliconP - Rolled PlateAp - StructureCd - Pierced
Cm - Micrography by SEMDf - Granular structure
Micrography of the plate in a section, showing the alpha grains plus beta phase microstructure in the middle of the thickness. The sample was mechanically-electrolitically polished and etched with HF+HNO3+H2O solution.
27
VIEW
ML00144 / Aug.2018
Impact of a .380 Winchester on Ti64 Plate
M - Ti6Al4VP - Rolled PlateAp - StructureCd - Non-Pierced
Cm - Micrography by SEMDf - Alpha and Beta

More from these cases

ML00145 — Impact of a .380 Winchester on 6061 T6 PlateM - Aluminum Magnesium SiliconP - Rolled PlateAp - StructureCd - Pierced
Micrographic detail, by scanning electron microscopy, of the precipitation hardened granular structure. The stains are preferential etch of second particles.
32
VIEW
ML00145 / Sep.2018
Impact of a .380 Winchester on 6061 T6 Plate
M - Aluminum Magnesium SiliconP - Rolled PlateAp - StructureCd - Pierced
Cm - Micrography by SEMDf - Aligned particles
ML00144 — Impact of a .380 Winchester on Ti64 PlateM - Ti6Al4VP - Rolled PlateAp - StructureCd - Non-Pierced
Micrographic detail by SEM, showing the beta phase EDS analysis was conducted in this microstructure and the results indicated 90.8%Ti + 6.8%Al + 2.4%V for the alpha phase (the dark grains as a matrix); and 84.7%Ti + 5.2%Al + 8.8%V + 1.2%Fe for the beta phase (light with aicular morphology inside the phase).
25
VIEW
ML00144 / Aug.2018
Impact of a .380 Winchester on Ti64 Plate
M - Ti6Al4VP - Rolled PlateAp - StructureCd - Non-Pierced
Cm - Micrography by SEMDf - Alpha and Beta