Scanning Electron Microscope

1 case · 3 images

Crevice Corrosion in a Subsea System — Aspect Before Analysis

Application: Ship Detail focus: Crack clear all

Scanning Electron Microscope — sub-branches

Micrography by SEM 2Nital Etched Micrography by SEM 1

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Detail by scanning electron microscopy of the pits in the metallographic longitudinal section of the clamp, at the surface (left side of the image). There are cracks emanating from the pits.
27
VIEW
ML00171 / Feb.2021
Corrosion Fatigue of U Bolt Pipe Clamp
M - Low Carbon SteelP - BoltAp - ShipCd - Corrosion Fatigue
Cm - Nital Etched Micrography by SEMDf - Crack

More from these cases

ML00171 — Corrosion Fatigue of U Bolt Pipe ClampM - Low Carbon SteelP - BoltAp - ShipCd - Corrosion Fatigue
Detail by scanning electron microscopy of the cracks emanating from the pits in the metallographic longitudinal section of the clamp, at the surface (left side of the image).
25
VIEW
ML00171 / Feb.2021
Corrosion Fatigue of U Bolt Pipe Clamp
M - Low Carbon SteelP - BoltAp - ShipCd - Corrosion Fatigue
Cm - Micrography by SEMDf - Crack
Corrosion Fatigue of U Bolt Pipe Clamp
4
VIEW
ML00171 / Feb.2021
Corrosion Fatigue of U Bolt Pipe Clamp
M - Low Carbon SteelP - BoltAp - ShipCd - Corrosion Fatigue
Cm - Micrography by SEMDf - Crack