





Ship
2 cases · 13 images
Crevice Corrosion in a Subsea System — Aspect Before Analysis

ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - NaOH Electrolytic Etched MicroDf - External Surface

ML00118 / Jan.2018
Non qualified GMAW of Aluminum Plates
M - Aluminum Magnesium ManganeseP - Welded Testpiece for QualificationAp - ShipCd - Non qualified
Cm - Keller Etched Micrography by OMDf - Base Metal
More from these cases

ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - NaOH Electrolytic Etched MicroDf - Close to the External Surface

ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - NaOH Electrolytic Etched MicroDf - In the Center of the Thickness

ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - NaOH Electrolytic Etched MicroDf - Internal Surface

ML00118 / Jan.2018
Non qualified GMAW of Aluminum Plates
M - Aluminum Magnesium ManganeseP - Welded Testpiece for QualificationAp - ShipCd - Non qualified
Cm - Keller Etched Micrography by OMDf - Base Metal

ML00118 / Jan.2018
Non qualified GMAW of Aluminum Plates
M - Aluminum Magnesium ManganeseP - Welded Testpiece for QualificationAp - ShipCd - Non qualified
Cm - Keller Etched Micrography by OMDf - Base Metal

ML00118 / Jan.2018
Non qualified GMAW of Aluminum Plates
M - Aluminum Magnesium ManganeseP - Welded Testpiece for QualificationAp - ShipCd - Non qualified
Cm - Keller Etched Micrography by OMDf - Last Bead HAZ

ML00118 / Jan.2018
Non qualified GMAW of Aluminum Plates
M - Aluminum Magnesium ManganeseP - Welded Testpiece for QualificationAp - ShipCd - Non qualified
Cm - Keller Etched Micrography by OMDf - Last Bead HAZ

ML00118 / Jan.2018
Non qualified GMAW of Aluminum Plates
M - Aluminum Magnesium ManganeseP - Welded Testpiece for QualificationAp - ShipCd - Non qualified
Cm - Keller Etched Micrography by OMDf - Last Bead HAZ