Welding Defect

1 case · 5 images

Crevice Corrosion in a Subsea System — Aspect Before Analysis

Microstructure: Tempered Martensite Capture method: Optical Microscope clear all

Welding Defect — sub-branches

Hot cracking 5

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Micrography in low magnification, as polished, of the crack in the the repair weld metal, showing the dendritic aspect of the hot cracks, formed during welding due to the high content of impurities in a high strength weld metal.
26
VIEW
ML00162 / Apr.2020
Valve Body Crack Growth from Weld Defects
M - Low Alloy Medium Carbon QTP - Valve BodyAp - O&G Well DrillingCd - Fatigue Induced by a Defect
Cm - As polished micrographyDf - Hot cracking

More from these cases

ML00162 — Valve Body Crack Growth from Weld DefectsM - Low Alloy Medium Carbon QTP - Valve BodyAp - O&G Well DrillingCd - Fatigue Induced by a Defect
Micrography, as polished, of the hot cracks with rounded morphology.
27
VIEW
ML00162 / Apr.2020
Valve Body Crack Growth from Weld Defects
M - Low Alloy Medium Carbon QTP - Valve BodyAp - O&G Well DrillingCd - Fatigue Induced by a Defect
Cm - As polished micrographyDf - Hot cracking
Micrographic detail, as polished, of the hot cracks with rounded interdenritic morphology.
26
VIEW
ML00162 / Apr.2020
Valve Body Crack Growth from Weld Defects
M - Low Alloy Medium Carbon QTP - Valve BodyAp - O&G Well DrillingCd - Fatigue Induced by a Defect
Cm - As polished micrographyDf - Hot cracking
Micrographic detail of the weld metal presenting hot cracks, at interdendritic positions, interconected.
28
VIEW
ML00162 / Apr.2020
Valve Body Crack Growth from Weld Defects
M - Low Alloy Medium Carbon QTP - Valve BodyAp - O&G Well DrillingCd - Fatigue Induced by a Defect
Cm - Nital Etched Micrography by OMDf - Hot cracking
Cross-sectional micrograph showing a wide, irregular crack with branching dark deposits through the polished matrix, alongside scattered small voids.
3
VIEW
ML00162 / Apr.2020
Valve Body Crack Growth from Weld Defects
M - Low Alloy Medium Carbon QTP - Valve BodyAp - O&G Well DrillingCd - Fatigue Induced by a Defect
Cm - As polished micrographyDf - Hot cracking