Microstructure

2 cases · 4 images

Crevice Corrosion in a Subsea System — Aspect Before Analysis

Condition: Damage Capture method: Electrolytic Etch Micrography by SEM clear all

Microstructure — sub-branches

Delta ferrite 1Sigma 1Thermal Spray Layer 2

Results

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Micrographic detail by scanning electron microscopy of the interface between the two thermal spray layers, the first one in stainless steel (bottom of the figure) and the second one, at the surface,in tungsten carbide (top of the figure). The composition of the first layer is similar to the base metal (lean duplex) and the composition of the second layer is WC in a Co matrix.
16
VIEW
ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - Electrolytic Etch Micrography by SEMDf - Thermal Spray Layer
Micrographic detail of the ferrite network with evidences of precipitation/formation of detrimental phases. NaOH solution was adopted for the electrolytic etching.
86
VIEW
ML00002 / Jan.2018
Preferential Dissolution and Cracks in SDSS
M - Super Duplex Stainless SteelP - Fabrication WeldAp - PipingCd - Preferential Dissolution
Cm - Electrolytic Etch Micrography by SEMDf - Delta ferrite

More from these cases

ML00147 — WC Layer Detached from a Cast Lean DuplexM - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Micrographic detail of the first thermal spray layer, in stainless steel with the same composition of the base metal (lean duplex).
16
VIEW
ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - Electrolytic Etch Micrography by SEMDf - Thermal Spray Layer
Micrographic detail, by scanning electron microscopy, of the duplex, austenitic and ferritic, structure with sigma phase.
16
VIEW
ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - Electrolytic Etch Micrography by SEMDf - Sigma