





Scanning Electron Microscope
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Crevice Corrosion in a Subsea System — Aspect Before Analysis
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Application
- Siblings — Other options under the same parent as "Structure" (36): 29 images
- Parent — "Structure" is already a root — nothing to go up to: 0 images
- Related by shared facet — Results for the other active filters, ignoring "Structure": 29 images
Condition
- Siblings — Other options under the same parent as "Fabrication Defect" (10): 17 images
- Parent — The entire "Damage" branch (parent of "Fabrication Defect"): 17 images
- Related by shared facet — Results for the other active filters, ignoring "Fabrication Defect": 19 images
Standard
- Siblings — Other options under the same parent as "A" (3): 0 images
- Parent — The entire "ASTM" branch (parent of "A"): 0 images
- Related by shared facet — Results for the other active filters, ignoring "A": 0 images
Capture method
- Siblings — Other options under the same parent as "Scanning Electron Microscope" (11): 16 images
- Parent — "Scanning Electron Microscope" is already a root — nothing to go up to: 0 images
- Related by shared facet — Results for the other active filters, ignoring "Scanning Electron Microscope": 16 images