Electrolytic Etch Micrography by SEM

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Crevice Corrosion in a Subsea System — Aspect Before Analysis

Detail focus: Sigma clear all

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Micrographic detail, by scanning electron microscopy, of the duplex, austenitic and ferritic, structure with sigma phase.
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ML00147 / Aug.2018
WC Layer Detached from a Cast Lean Duplex
M - Lean Duplex Stainless SteelP - Centrifugal CastingAp - ShipCd - Lack of Sealing
Cm - Electrolytic Etch Micrography by SEMDf - Sigma